TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_28_57
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-003-016-09 | FUSED_ID : 6359364768411693321
  IC_TEMP :  -62.93 | VDDM : 1110.91 | AUX_INT :   -9.91 | CsaBias :   74.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.78129e-03 / 2
  ADC_P0  : -9.91307e-03 ± 2.85939e-02
  ADC_P1  : 8.54312e-03 ± 7.02618e-04
  ADC_P2  : -6.24788e-06 ± 3.44832e-06
  CSA_Chi2/NDF : 1.69365e-04 / 2
  CSA_P0  : 5.53454e-02 ± 8.68028e-03
  CSA_P1  : 9.85448e-03 ± 6.53997e-04
  CSA_P2  : -4.79796e-05 ± 9.95959e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [43, 53]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [14]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3527', '1.800', '0.1322', '1.800', '0.0920', '7.000', '0.7074', 1, 1, 1, 1, 1728383337.4347975]
VI_after__Init : ['1.201', '0.3526', '1.800', '0.1323', '1.800', '0.0863', '7.000', '0.7075', 1, 1, 1, 1, 1728383345.520179]
VI_at__the_End : ['1.201', '0.4813', '1.800', '0.1360', '1.800', '0.1127', '7.000', '0.7080', 1, 1, 1, 1, 1728383410.9792855]