TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_25_40
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-003-018-09 | FUSED_ID : 6359364768411693353
  IC_TEMP :  -63.41 | VDDM : 1122.19 | AUX_INT :   -8.79 | CsaBias :   79.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58569e-03 / 2
  ADC_P0  : -8.78682e-03 ± 2.70696e-02
  ADC_P1  : 8.11485e-03 ± 6.56008e-04
  ADC_P2  : -4.72433e-06 ± 3.16257e-06
  CSA_Chi2/NDF : 1.24137e-04 / 2
  CSA_P0  : 5.56806e-02 ± 7.43144e-03
  CSA_P1  : 9.63649e-03 ± 5.59906e-04
  CSA_P2  : -4.58764e-05 ± 8.52670e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [69, 92]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2141', '1.800', '0.1451', '1.800', '0.0954', '7.000', '0.7080', 1, 1, 1, 1, 1728383140.3225818]
VI_after__Init : ['1.202', '0.2141', '1.800', '0.1451', '1.800', '0.0881', '7.000', '0.7070', 1, 1, 1, 1, 1728383148.5330207]
VI_at__the_End : ['1.201', '0.4768', '1.800', '0.1363', '1.800', '0.1160', '7.000', '0.7080', 1, 1, 1, 1, 1728383212.0852265]