TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_24_01
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-003-019-09 | FUSED_ID : 6359364768411693369
  IC_TEMP :  -62.21 | VDDM : 1099.05 | AUX_INT :   -9.07 | CsaBias :   74.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36045e-03 / 2
  ADC_P0  : -9.07194e-03 ± 2.49733e-02
  ADC_P1  : 8.45496e-03 ± 6.10971e-04
  ADC_P2  : -6.23622e-06 ± 2.96550e-06
  CSA_Chi2/NDF : 1.49096e-04 / 2
  CSA_P0  : 5.81065e-02 ± 8.14432e-03
  CSA_P1  : 9.95196e-03 ± 6.13616e-04
  CSA_P2  : -4.70400e-05 ± 9.34464e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [48, 50, 67]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2549', '1.800', '0.1622', '1.800', '0.0877', '7.000', '0.7072', 1, 1, 1, 1, 1728383041.7828882]
VI_after__Init : ['1.202', '0.2550', '1.800', '0.1622', '1.800', '0.0823', '7.000', '0.7070', 1, 1, 1, 1, 1728383050.0593002]
VI_at__the_End : ['1.201', '0.4934', '1.800', '0.1355', '1.800', '0.1114', '7.000', '0.7079', 1, 1, 1, 1, 1728383117.8962274]