TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_22_23
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-003-020-09 | FUSED_ID : 6359364768411693385
  IC_TEMP :  -65.26 | VDDM : 1117.87 | AUX_INT :   -8.66 | CsaBias :   77.48
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62420e-03 / 2
  ADC_P0  : -8.66249e-03 ± 2.73174e-02
  ADC_P1  : 8.68038e-03 ± 6.84761e-04
  ADC_P2  : -6.60562e-06 ± 3.40800e-06
  CSA_Chi2/NDF : 1.45713e-04 / 2
  CSA_P0  : 5.92743e-02 ± 8.05139e-03
  CSA_P1  : 9.71559e-03 ± 6.06614e-04
  CSA_P2  : -4.49027e-05 ± 9.23802e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [82, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [0, 67]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1579', '1.800', '0.1581', '1.800', '0.0858', '7.000', '0.7076', 1, 1, 1, 1, 1728382942.9113114]
VI_after__Init : ['1.202', '0.1579', '1.800', '0.1579', '1.800', '0.0788', '7.000', '0.7068', 1, 1, 1, 1, 1728382951.0787156]
VI_at__the_End : ['1.202', '0.4866', '1.800', '0.1408', '1.800', '0.1146', '7.000', '0.7078', 1, 1, 1, 1, 1728383005.5366604]