TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_20_44
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-003-021-09 | FUSED_ID : 6359364768411693401
  IC_TEMP :  -59.89 | VDDM : 1115.48 | AUX_INT :  -10.75 | CsaBias :   71.36
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.01582e-03 / 2
  ADC_P0  : -1.07527e-02 ± 3.05079e-02
  ADC_P1  : 8.26514e-03 ± 7.36389e-04
  ADC_P2  : -5.34201e-06 ± 3.55342e-06
  CSA_Chi2/NDF : 1.62905e-04 / 2
  CSA_P0  : 5.70942e-02 ± 8.51313e-03
  CSA_P1  : 9.95843e-03 ± 6.41403e-04
  CSA_P2  : -4.68107e-05 ± 9.76781e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [62]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [15]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3655', '1.800', '0.1739', '1.800', '0.0972', '7.000', '0.7072', 1, 1, 1, 1, 1728382844.0047488]
VI_after__Init : ['1.201', '0.3654', '1.800', '0.1740', '1.800', '0.0919', '7.000', '0.7069', 1, 1, 1, 1, 1728382852.0770352]
VI_at__the_End : ['1.202', '0.4942', '1.799', '0.1367', '1.800', '0.1140', '7.000', '0.7079', 1, 1, 1, 1, 1728382918.095086]