TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_19_05
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-003-022-09 | FUSED_ID : 6359364768411693417
  IC_TEMP :  -59.64 | VDDM : 1118.84 | AUX_INT :   -9.68 | CsaBias :   79.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.84704e-03 / 2
  ADC_P0  : -9.68081e-03 ± 2.92449e-02
  ADC_P1  : 8.17221e-03 ± 7.13467e-04
  ADC_P2  : -4.62608e-06 ± 3.47500e-06
  CSA_Chi2/NDF : 1.20330e-04 / 2
  CSA_P0  : 5.87937e-02 ± 7.31660e-03
  CSA_P1  : 9.79033e-03 ± 5.51253e-04
  CSA_P2  : -4.50062e-05 ± 8.39493e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [4, 7, 64]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [53, 70]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.4296', '1.800', '0.1486', '1.800', '0.1024', '7.000', '0.7079', 1, 1, 1, 1, 1728382745.443029]
VI_after__Init : ['1.202', '0.4299', '1.800', '0.1487', '1.800', '0.0957', '7.000', '0.7069', 1, 1, 1, 1, 1728382753.4803412]
VI_at__the_End : ['1.202', '0.4931', '1.800', '0.1376', '1.803', '0.1149', '7.000', '0.7081', 1, 1, 1, 1, 1728382818.3236144]