TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_45_22
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-004-006-06 | FUSED_ID : 6359364768411697254
  IC_TEMP :  -68.50 | VDDM : 1113.95 | AUX_INT :  -10.67 | CsaBias :   58.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.96004e-03 / 2
  ADC_P0  : -1.06738e-02 ± 3.00414e-02
  ADC_P1  : 8.75586e-03 ± 7.58205e-04
  ADC_P2  : -6.56912e-06 ± 3.81339e-06
  CSA_Chi2/NDF : 2.55234e-04 / 2
  CSA_P0  : 5.63633e-02 ± 1.06559e-02
  CSA_P1  : 1.02658e-02 ± 8.02848e-04
  CSA_P2  : -5.54326e-05 ± 1.22264e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [7, 40, 87, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3022', '1.800', '0.1495', '1.800', '0.0902', '7.000', '0.7088', 1, 1, 1, 1, 1728384321.7821553]
VI_after__Init : ['1.201', '0.3021', '1.800', '0.1493', '1.800', '0.0828', '7.000', '0.7078', 1, 1, 1, 1, 1728384329.7794607]
VI_at__the_End : ['1.201', '0.4803', '1.801', '0.1372', '1.800', '0.1126', '7.000', '0.7085', 1, 1, 1, 1, 1728384391.478734]