TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_47_00
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-004-007-06 | FUSED_ID : 6359364768411697270
  IC_TEMP :  -60.86 | VDDM : 1114.16 | AUX_INT :   -8.45 | CsaBias :   63.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36165e-03 / 2
  ADC_P0  : -8.45447e-03 ± 2.50483e-02
  ADC_P1  : 8.08320e-03 ± 6.01804e-04
  ADC_P2  : -4.87502e-06 ± 2.87482e-06
  CSA_Chi2/NDF : 1.66329e-04 / 2
  CSA_P0  : 5.87823e-02 ± 8.60215e-03
  CSA_P1  : 1.01045e-02 ± 6.48110e-04
  CSA_P2  : -5.04728e-05 ± 9.86994e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [16]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2619', '1.800', '0.1432', '1.800', '0.0926', '7.000', '0.7079', 1, 1, 1, 1, 1728384420.8174517]
VI_after__Init : ['1.201', '0.2619', '1.800', '0.1431', '1.800', '0.0870', '7.000', '0.7076', 1, 1, 1, 1, 1728384429.036836]
VI_at__the_End : ['1.201', '0.4906', '1.800', '0.1382', '1.800', '0.1150', '7.000', '0.7085', 1, 1, 1, 1, 1728384487.541225]