TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_50_16
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-004-009-06 | FUSED_ID : 6359364768411697302
  IC_TEMP :  -64.82 | VDDM : 1109.96 | AUX_INT :   -8.19 | CsaBias :   87.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20257e-03 / 2
  ADC_P0  : -8.19468e-03 ± 2.34984e-02
  ADC_P1  : 8.07475e-03 ± 5.57975e-04
  ADC_P2  : -5.28577e-06 ± 2.62704e-06
  CSA_Chi2/NDF : 1.86702e-04 / 2
  CSA_P0  : 5.72999e-02 ± 9.11375e-03
  CSA_P1  : 1.00730e-02 ± 6.86655e-04
  CSA_P2  : -5.04433e-05 ± 1.04569e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [13]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2802', '1.800', '0.1682', '1.799', '0.0959', '7.000', '0.7079', 1, 1, 1, 1, 1728384616.1083336]
VI_after__Init : ['1.201', '0.2802', '1.800', '0.1683', '1.799', '0.0902', '7.000', '0.7079', 1, 1, 1, 1, 1728384624.838609]
VI_at__the_End : ['1.201', '0.4857', '1.800', '0.1398', '1.801', '0.1152', '7.000', '0.7083', 1, 1, 1, 1, 1728384686.6578164]