TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_51_55
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-004-010-06 | FUSED_ID : 6359364768411697318
  IC_TEMP :  -61.45 | VDDM : 1113.07 | AUX_INT :   -8.29 | CsaBias :   83.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40502e-03 / 2
  ADC_P0  : -8.28880e-03 ± 2.54635e-02
  ADC_P1  : 8.37259e-03 ± 6.37466e-04
  ADC_P2  : -5.06305e-06 ± 3.17063e-06
  CSA_Chi2/NDF : 1.30913e-04 / 2
  CSA_P0  : 5.91725e-02 ± 7.63157e-03
  CSA_P1  : 9.77499e-03 ± 5.74984e-04
  CSA_P2  : -4.58739e-05 ± 8.75632e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [85]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [91]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2580', '1.800', '0.1269', '1.800', '0.0873', '7.000', '0.7076', 1, 1, 1, 1, 1728384715.2745988]
VI_after__Init : ['1.202', '0.2580', '1.800', '0.1269', '1.800', '0.0817', '7.000', '0.7077', 1, 1, 1, 1, 1728384723.3059764]
VI_at__the_End : ['1.202', '0.4888', '1.800', '0.1399', '1.805', '0.1142', '7.000', '0.7086', 1, 1, 1, 1, 1728384780.8335407]