TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_53_33
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-004-011-06 | FUSED_ID : 6359364768411697334
  IC_TEMP :  -61.84 | VDDM : 1109.47 | AUX_INT :  -18.23 | CsaBias :   73.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55248e-03 / 2
  ADC_P0  : -1.82318e-02 ± 2.71732e-02
  ADC_P1  : 8.38443e-03 ± 6.50122e-04
  ADC_P2  : -6.06779e-06 ± 3.09576e-06
  CSA_Chi2/NDF : 1.89950e-04 / 2
  CSA_P0  : 5.75746e-02 ± 9.19267e-03
  CSA_P1  : 9.89719e-03 ± 6.92601e-04
  CSA_P2  : -4.93745e-05 ± 1.05475e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [54]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [80, 91]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2881', '1.800', '0.1655', '1.800', '0.0897', '7.000', '0.7078', 1, 1, 1, 1, 1728384813.2950768]
VI_after__Init : ['1.202', '0.2883', '1.800', '0.1656', '1.800', '0.0842', '7.000', '0.7077', 1, 1, 1, 1, 1728384821.4374688]
VI_at__the_End : ['1.202', '0.4801', '1.800', '0.1371', '1.803', '0.1129', '7.000', '0.7086', 1, 1, 1, 1, 1728384883.9056764]