TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_55_12
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-004-012-06 | FUSED_ID : 6359364768411697350
  IC_TEMP :  -62.23 | VDDM : 1118.93 | AUX_INT :   -8.89 | CsaBias :   73.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.78954e-03 / 2
  ADC_P0  : -8.89040e-03 ± 2.87306e-02
  ADC_P1  : 8.33171e-03 ± 7.02333e-04
  ADC_P2  : -5.71330e-06 ± 3.40039e-06
  CSA_Chi2/NDF : 1.45057e-04 / 2
  CSA_P0  : 5.77479e-02 ± 8.03325e-03
  CSA_P1  : 9.76562e-03 ± 6.05248e-04
  CSA_P2  : -4.71564e-05 ± 9.21721e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [44, 64, 83]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [4, 75]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3017', '1.800', '0.1538', '1.800', '0.0950', '7.000', '0.7077', 1, 1, 1, 1, 1728384912.6175833]
VI_after__Init : ['1.201', '0.3019', '1.800', '0.1538', '1.801', '0.0893', '7.000', '0.7078', 1, 1, 1, 1, 1728384920.613812]
VI_at__the_End : ['1.201', '0.4817', '1.800', '0.1349', '1.799', '0.1150', '7.000', '0.7084', 1, 1, 1, 1, 1728384985.3350034]