TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_00_08
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-004-015-06 | FUSED_ID : 6359364768411697398
  IC_TEMP :  -66.34 | VDDM : 1113.41 | AUX_INT :   -8.36 | CsaBias :   65.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10649e-03 / 2
  ADC_P0  : -8.36201e-03 ± 2.24978e-02
  ADC_P1  : 8.23059e-03 ± 5.37519e-04
  ADC_P2  : -5.87400e-06 ± 2.54600e-06
  CSA_Chi2/NDF : 1.78389e-04 / 2
  CSA_P0  : 5.71805e-02 ± 8.90854e-03
  CSA_P1  : 1.00307e-02 ± 6.71194e-04
  CSA_P2  : -5.21885e-05 ± 1.02215e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [9, 30, 69, 76, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4218', '1.800', '0.1705', '1.800', '0.0996', '7.000', '0.7078', 1, 1, 1, 1, 1728385208.5437949]
VI_after__Init : ['1.201', '0.4227', '1.800', '0.1707', '1.799', '0.0942', '7.000', '0.7081', 1, 1, 1, 1, 1728385216.7281442]
VI_at__the_End : ['1.201', '0.4767', '1.799', '0.1365', '1.799', '0.1127', '7.000', '0.7086', 1, 1, 1, 1, 1728385282.8251066]