TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_01_47
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-004-016-01 | FUSED_ID : 6359364768411697409
  IC_TEMP :  -61.37 | VDDM : 1098.73 | AUX_INT :   -9.71 | CsaBias :   71.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52688e-03 / 2
  ADC_P0  : -9.70742e-03 ± 2.64860e-02
  ADC_P1  : 8.18087e-03 ± 6.29675e-04
  ADC_P2  : -5.56449e-06 ± 2.98061e-06
  CSA_Chi2/NDF : 1.30432e-04 / 2
  CSA_P0  : 5.64905e-02 ± 7.61754e-03
  CSA_P1  : 9.59697e-03 ± 5.73926e-04
  CSA_P2  : -4.51703e-05 ± 8.74022e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [78, 89]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [76]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2003', '1.800', '0.1337', '1.800', '0.0856', '7.000', '0.7079', 1, 1, 1, 1, 1728385307.1351826]
VI_after__Init : ['1.201', '0.2002', '1.800', '0.1337', '1.799', '0.0803', '7.000', '0.7077', 1, 1, 1, 1, 1728385315.832559]
VI_at__the_End : ['1.201', '0.4778', '1.800', '0.1362', '1.800', '0.1132', '7.000', '0.7086', 1, 1, 1, 1, 1728385370.5072727]