TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_03_26
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-004-017-01 | FUSED_ID : 6359364768411697425
  IC_TEMP :  -53.72 | VDDM : 1108.52 | AUX_INT :  -65.05 | CsaBias :   27.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.68489e-03 / 2
  ADC_P0  : -6.50463e-02 ± 3.11776e-02
  ADC_P1  : 9.35945e-03 ± 7.67298e-04
  ADC_P2  : -8.73017e-06 ± 3.71784e-06
  CSA_Chi2/NDF : 1.20959e-04 / 2
  CSA_P0  : 5.81698e-02 ± 7.33569e-03
  CSA_P1  : 9.52454e-03 ± 5.52691e-04
  CSA_P2  : -4.17119e-05 ± 8.41684e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3942', '1.800', '0.1367', '1.800', '0.0907', '7.000', '0.7080', 1, 1, 1, 1, 1728385406.1136398]
VI_after__Init : ['1.201', '0.3943', '1.799', '0.1367', '1.800', '0.0851', '7.000', '0.7078', 1, 1, 1, 1, 1728385414.1630704]
VI_at__the_End : ['1.201', '0.4917', '1.800', '0.1399', '1.799', '0.1092', '7.000', '0.7085', 1, 1, 1, 1, 1728385476.4661767]