TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_05_05
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-004-018-01 | FUSED_ID : 6359364768411697441
  IC_TEMP :  -54.29 | VDDM : 1117.83 | AUX_INT :   -9.60 | CsaBias :   87.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.51349e-03 / 2
  ADC_P0  : -9.59738e-03 ± 2.63696e-02
  ADC_P1  : 8.17585e-03 ± 6.26908e-04
  ADC_P2  : -5.55109e-06 ± 2.96751e-06
  CSA_Chi2/NDF : 1.33936e-04 / 2
  CSA_P0  : 5.92979e-02 ± 7.71917e-03
  CSA_P1  : 9.90047e-03 ± 5.81584e-04
  CSA_P2  : -4.48649e-05 ± 8.85683e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [34, 53]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3033', '1.800', '0.1707', '1.799', '0.0882', '7.000', '0.7079', 1, 1, 1, 1, 1728385504.7590754]
VI_after__Init : ['1.201', '0.3030', '1.800', '0.1706', '1.799', '0.0836', '7.000', '0.7077', 1, 1, 1, 1, 1728385512.7624586]
VI_at__the_End : ['1.201', '0.5009', '1.800', '0.1415', '1.800', '0.1098', '7.000', '0.7085', 1, 1, 1, 1, 1728385580.094379]