TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_06_43
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-004-019-01 | FUSED_ID : 6359364768411697457
  IC_TEMP :  -57.22 | VDDM : 1113.55 | AUX_INT :   -7.39 | CsaBias :   90.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21889e-03 / 2
  ADC_P0  : -7.39009e-03 ± 2.36761e-02
  ADC_P1  : 8.18443e-03 ± 5.74807e-04
  ADC_P2  : -5.32777e-06 ± 2.75743e-06
  CSA_Chi2/NDF : 1.14496e-04 / 2
  CSA_P0  : 5.71149e-02 ± 7.13702e-03
  CSA_P1  : 9.48479e-03 ± 5.37723e-04
  CSA_P2  : -4.06933e-05 ± 8.18889e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [24]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1557', '1.800', '0.1811', '1.800', '0.0844', '7.000', '0.7086', 1, 1, 1, 1, 1728385603.7474985]
VI_after__Init : ['1.202', '0.1557', '1.800', '0.1811', '1.799', '0.0775', '7.000', '0.7080', 1, 1, 1, 1, 1728385611.7938673]
VI_at__the_End : ['1.201', '0.4894', '1.800', '0.1352', '1.799', '0.1102', '7.000', '0.7089', 1, 1, 1, 1, 1728385667.3596132]