TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_08_22
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-004-020-01 | FUSED_ID : 6359364768411697473
  IC_TEMP :  -60.55 | VDDM : 1123.44 | AUX_INT :   -7.47 | CsaBias :   61.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02352e-03 / 2
  ADC_P0  : -7.47461e-03 ± 2.16833e-02
  ADC_P1  : 8.61532e-03 ± 5.56234e-04
  ADC_P2  : -5.62717e-06 ± 2.82954e-06
  CSA_Chi2/NDF : 1.79374e-04 / 2
  CSA_P0  : 5.93296e-02 ± 8.93309e-03
  CSA_P1  : 1.03720e-02 ± 6.73044e-04
  CSA_P2  : -5.25218e-05 ± 1.02497e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [23]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [82, 94, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3111', '1.800', '0.1390', '1.800', '0.0908', '7.000', '0.7078', 1, 1, 1, 1, 1728385702.188954]
VI_after__Init : ['1.202', '0.3113', '1.800', '0.1389', '1.801', '0.0856', '7.000', '0.7080', 1, 1, 1, 1, 1728385710.2983606]
VI_at__the_End : ['1.201', '0.4976', '1.800', '0.1393', '1.799', '0.1121', '7.000', '0.7087', 1, 1, 1, 1, 1728385769.341816]