TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_10_00
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-004-021-01 | FUSED_ID : 6359364768411697489
  IC_TEMP :  -55.24 | VDDM : 1124.67 | AUX_INT :   -8.78 | CsaBias :   79.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25068e-03 / 2
  ADC_P0  : -8.78395e-03 ± 2.39536e-02
  ADC_P1  : 8.10185e-03 ± 5.67587e-04
  ADC_P2  : -5.35956e-06 ± 2.67467e-06
  CSA_Chi2/NDF : 1.37702e-04 / 2
  CSA_P0  : 5.77787e-02 ± 7.82696e-03
  CSA_P1  : 1.01173e-02 ± 5.89705e-04
  CSA_P2  : -4.58411e-05 ± 8.98050e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [19, 44, 47]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [8, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2177', '1.800', '0.1539', '1.800', '0.0919', '7.000', '0.7080', 1, 1, 1, 1, 1728385800.2095664]
VI_after__Init : ['1.202', '0.2177', '1.800', '0.1540', '1.802', '0.0864', '7.000', '0.7077', 1, 1, 1, 1, 1728385809.0508878]
VI_at__the_End : ['1.201', '0.5091', '1.800', '0.1373', '1.799', '0.1105', '7.000', '0.7086', 1, 1, 1, 1, 1728385866.4874668]