TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_11_39
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-004-022-01 | FUSED_ID : 6359364768411697505
  IC_TEMP :  -55.04 | VDDM : 1113.18 | AUX_INT :   -6.27 | CsaBias :   80.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.84226e-04 / 2
  ADC_P0  : -6.27478e-03 ± 2.01642e-02
  ADC_P1  : 7.91268e-03 ± 4.82242e-04
  ADC_P2  : -4.45400e-06 ± 2.28059e-06
  CSA_Chi2/NDF : 1.17264e-04 / 2
  CSA_P0  : 5.78118e-02 ± 7.22280e-03
  CSA_P1  : 9.52241e-03 ± 5.44186e-04
  CSA_P2  : -3.92853e-05 ± 8.28730e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [9, 79, 93]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [16, 62]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2234', '1.800', '0.1686', '1.800', '0.0876', '7.000', '0.7089', 1, 1, 1, 1, 1728385899.2148838]
VI_after__Init : ['1.201', '0.2234', '1.800', '0.1680', '1.799', '0.0800', '7.000', '0.7079', 1, 1, 1, 1, 1728385907.3113694]
VI_at__the_End : ['1.201', '0.5000', '1.800', '0.1372', '1.800', '0.1085', '7.000', '0.7090', 1, 1, 1, 1, 1728385972.5004153]