TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_47_43
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-005-005-11 | FUSED_ID : 6359364768411701339
  IC_TEMP :  -58.16 | VDDM : 1113.98 | AUX_INT :   -6.57 | CsaBias :   82.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.81332e-04 / 2
  ADC_P0  : -6.56887e-03 ± 2.12281e-02
  ADC_P1  : 8.10940e-03 ± 5.13643e-04
  ADC_P2  : -5.13444e-06 ± 2.45278e-06
  CSA_Chi2/NDF : 1.41263e-04 / 2
  CSA_P0  : 5.49120e-02 ± 7.92750e-03
  CSA_P1  : 9.67688e-03 ± 5.97280e-04
  CSA_P2  : -4.36097e-05 ± 9.09587e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [39, 90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1738', '1.800', '0.1733', '1.800', '0.0870', '7.000', '0.7084', 1, 1, 1, 1, 1728388063.5266783]
VI_after__Init : ['1.202', '0.1740', '1.800', '0.1731', '1.800', '0.0801', '7.000', '0.7073', 1, 1, 1, 1, 1728388071.825933]
VI_at__the_End : ['1.202', '0.4854', '1.800', '0.1367', '1.804', '0.1097', '7.000', '0.7086', 1, 1, 1, 1, 1728388134.5833004]