TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_46_05
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-005-006-11 | FUSED_ID : 6359364768411701355
  IC_TEMP :  -57.46 | VDDM : 1115.32 | AUX_INT :   -7.85 | CsaBias :   73.48
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33081e-03 / 2
  ADC_P0  : -7.85054e-03 ± 2.47905e-02
  ADC_P1  : 8.17928e-03 ± 6.11128e-04
  ADC_P2  : -4.61008e-06 ± 2.99210e-06
  CSA_Chi2/NDF : 1.84757e-04 / 2
  CSA_P0  : 5.69258e-02 ± 9.06614e-03
  CSA_P1  : 1.01036e-02 ± 6.83068e-04
  CSA_P2  : -4.87750e-05 ± 1.04023e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [92, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3384', '1.800', '0.1329', '1.799', '0.0875', '7.000', '0.7079', 1, 1, 1, 1, 1728387964.7261019]
VI_after__Init : ['1.202', '0.3385', '1.800', '0.1329', '1.800', '0.0824', '7.000', '0.7079', 1, 1, 1, 1, 1728387972.7955816]
VI_at__the_End : ['1.202', '0.4934', '1.800', '0.1414', '1.800', '0.1068', '7.000', '0.7083', 1, 1, 1, 1, 1728388035.017671]