TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_39_30
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-005-010-11 | FUSED_ID : 6359364768411701419
  IC_TEMP :  -58.57 | VDDM : 1109.32 | AUX_INT :   -9.13 | CsaBias :   72.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43096e-03 / 2
  ADC_P0  : -9.13172e-03 ± 2.56763e-02
  ADC_P1  : 8.26072e-03 ± 6.28256e-04
  ADC_P2  : -5.06259e-06 ± 3.06473e-06
  CSA_Chi2/NDF : 1.67707e-04 / 2
  CSA_P0  : 5.72144e-02 ± 8.63771e-03
  CSA_P1  : 9.96058e-03 ± 6.50789e-04
  CSA_P2  : -4.90274e-05 ± 9.91074e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [36, 45, 51, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [1, 7]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1012', '1.800', '0.1293', '1.800', '0.0825', '7.000', '0.7080', 1, 1, 1, 1, 1728387569.7716827]
VI_after__Init : ['1.202', '0.1012', '1.800', '0.1293', '1.800', '0.0772', '7.000', '0.7082', 1, 1, 1, 1, 1728387578.4990056]
VI_at__the_End : ['1.201', '0.4862', '1.800', '0.1325', '1.803', '0.1090', '7.000', '0.7090', 1, 1, 1, 1, 1728387640.788112]