TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_37_52
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-005-011-11 | FUSED_ID : 6359364768411701435
  IC_TEMP :  -58.10 | VDDM : 1104.87 | AUX_INT :   -6.57 | CsaBias :   74.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.10455e-04 / 2
  ADC_P0  : -6.56790e-03 ± 2.03891e-02
  ADC_P1  : 8.14888e-03 ± 4.83551e-04
  ADC_P2  : -6.05043e-06 ± 2.25375e-06
  CSA_Chi2/NDF : 7.20728e-05 / 2
  CSA_P0  : 5.79222e-02 ± 5.66250e-03
  CSA_P1  : 8.83574e-03 ± 4.26628e-04
  CSA_P2  : -3.30324e-05 ± 6.49705e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [92, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [43, 49, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3334', '1.800', '0.1471', '1.800', '0.0895', '7.000', '0.7081', 1, 1, 1, 1, 1728387471.4782648]
VI_after__Init : ['1.202', '0.3340', '1.800', '0.1471', '1.800', '0.0842', '7.000', '0.7081', 1, 1, 1, 1, 1728387480.3376846]
VI_at__the_End : ['1.202', '0.4813', '1.800', '0.1342', '1.800', '0.1092', '7.000', '0.7090', 1, 1, 1, 1, 1728387543.576766]