TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_36_13
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-005-012-11 | FUSED_ID : 6359364768411701451
  IC_TEMP :  -69.10 | VDDM : 1120.47 | AUX_INT :  -10.23 | CsaBias :   66.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.77413e-03 / 2
  ADC_P0  : -1.02347e-02 ± 2.86007e-02
  ADC_P1  : 8.54430e-03 ± 7.13039e-04
  ADC_P2  : -5.79897e-06 ± 3.54995e-06
  CSA_Chi2/NDF : 1.91407e-04 / 2
  CSA_P0  : 5.87244e-02 ± 9.22787e-03
  CSA_P1  : 1.03213e-02 ± 6.95253e-04
  CSA_P2  : -5.60841e-05 ± 1.05879e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [49]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2186', '1.800', '0.1187', '1.800', '0.0866', '7.000', '0.7079', 1, 1, 1, 1, 1728387372.5309656]
VI_after__Init : ['1.202', '0.2187', '1.800', '0.1186', '1.800', '0.0810', '7.000', '0.7081', 1, 1, 1, 1, 1728387380.7793202]
VI_at__the_End : ['1.202', '0.4797', '1.800', '0.1388', '1.800', '0.1149', '7.000', '0.7086', 1, 1, 1, 1, 1728387442.523586]