TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_34_35
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-005-013-11 | FUSED_ID : 6359364768411701467
  IC_TEMP :  -67.63 | VDDM : 1121.39 | AUX_INT :   -9.75 | CsaBias :   75.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.66909e-03 / 2
  ADC_P0  : -9.74582e-03 ± 2.76738e-02
  ADC_P1  : 8.54675e-03 ± 6.77265e-04
  ADC_P2  : -6.70578e-06 ± 3.28418e-06
  CSA_Chi2/NDF : 2.00589e-04 / 2
  CSA_P0  : 5.51635e-02 ± 9.44662e-03
  CSA_P1  : 1.02209e-02 ± 7.11734e-04
  CSA_P2  : -5.50562e-05 ± 1.08389e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [26, 87, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [65]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2988', '1.800', '0.1152', '1.800', '0.0881', '7.000', '0.7091', 1, 1, 1, 1, 1728387274.657566]
VI_after__Init : ['1.202', '0.2988', '1.800', '0.1152', '1.800', '0.0812', '7.000', '0.7081', 1, 1, 1, 1, 1728387283.4328852]
VI_at__the_End : ['1.202', '0.4763', '1.800', '0.1371', '1.800', '0.1150', '7.000', '0.7087', 1, 1, 1, 1, 1728387345.4990728]