TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_32_57
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-005-014-11 | FUSED_ID : 6359364768411701483
  IC_TEMP :  -63.05 | VDDM : 1125.34 | AUX_INT :   -9.08 | CsaBias :   68.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26737e-03 / 2
  ADC_P0  : -9.08451e-03 ± 2.40485e-02
  ADC_P1  : 8.63420e-03 ± 5.90215e-04
  ADC_P2  : -7.14254e-06 ± 2.86642e-06
  CSA_Chi2/NDF : 1.10296e-04 / 2
  CSA_P0  : 5.68522e-02 ± 7.00492e-03
  CSA_P1  : 9.70438e-03 ± 5.27770e-04
  CSA_P2  : -4.54598e-05 ± 8.03731e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [22, 38, 89]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [84]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3009', '1.800', '0.1527', '1.800', '0.0890', '7.000', '0.7082', 1, 1, 1, 1, 1728387176.5841417]
VI_after__Init : ['1.202', '0.3015', '1.800', '0.1529', '1.800', '0.0834', '7.000', '0.7079', 1, 1, 1, 1, 1728387185.3185422]
VI_at__the_End : ['1.202', '0.4842', '1.800', '0.1368', '1.800', '0.1111', '7.000', '0.7088', 1, 1, 1, 1, 1728387240.472181]