TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_31_18
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-005-015-11 | FUSED_ID : 6359364768411701499
  IC_TEMP :  -58.45 | VDDM : 1120.29 | AUX_INT :   -8.50 | CsaBias :   83.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28857e-03 / 2
  ADC_P0  : -8.49501e-03 ± 2.43230e-02
  ADC_P1  : 8.40742e-03 ± 5.98281e-04
  ADC_P2  : -5.88121e-06 ± 2.91751e-06
  CSA_Chi2/NDF : 1.08553e-04 / 2
  CSA_P0  : 5.75930e-02 ± 6.94934e-03
  CSA_P1  : 9.52299e-03 ± 5.23583e-04
  CSA_P2  : -4.12182e-05 ± 7.97355e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [70, 82, 89, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2461', '1.800', '0.1651', '1.800', '0.0863', '7.000', '0.7077', 1, 1, 1, 1, 1728387078.0207808]
VI_after__Init : ['1.201', '0.2462', '1.800', '0.1648', '1.800', '0.0807', '7.000', '0.7081', 1, 1, 1, 1, 1728387086.1152341]
VI_at__the_End : ['1.202', '0.4904', '1.800', '0.1356', '1.801', '0.1097', '7.000', '0.7086', 1, 1, 1, 1, 1728387147.5703766]