TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_29_39
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-005-016-12 | FUSED_ID : 6359364768411701516
  IC_TEMP :  -61.82 | VDDM : 1116.90 | AUX_INT :   -9.47 | CsaBias :   66.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54456e-03 / 2
  ADC_P0  : -9.46779e-03 ± 2.66580e-02
  ADC_P1  : 8.47245e-03 ± 6.60125e-04
  ADC_P2  : -5.82315e-06 ± 3.25245e-06
  CSA_Chi2/NDF : 1.48916e-04 / 2
  CSA_P0  : 6.10013e-02 ± 8.13941e-03
  CSA_P1  : 1.00786e-02 ± 6.13246e-04
  CSA_P2  : -5.06561e-05 ± 9.33901e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4790', '1.800', '0.1549', '1.800', '0.0991', '7.000', '0.7080', 1, 1, 1, 1, 1728386979.3164687]
VI_after__Init : ['1.201', '0.4799', '1.800', '0.1550', '1.800', '0.0939', '7.000', '0.7079', 1, 1, 1, 1, 1728386987.3218007]
VI_at__the_End : ['1.201', '0.4880', '1.800', '0.1401', '1.800', '0.1119', '7.000', '0.7089', 1, 1, 1, 1, 1728387048.0441298]