TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_28_01
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-005-017-12 | FUSED_ID : 6359364768411701532
  IC_TEMP :  -62.87 | VDDM : 1108.72 | AUX_INT :   -9.69 | CsaBias :   80.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74960e-03 / 2
  ADC_P0  : -9.68620e-03 ± 2.83849e-02
  ADC_P1  : 8.21759e-03 ± 6.78537e-04
  ADC_P2  : -5.65555e-06 ± 3.22361e-06
  CSA_Chi2/NDF : 1.37412e-04 / 2
  CSA_P0  : 5.79117e-02 ± 7.81871e-03
  CSA_P1  : 9.53203e-03 ± 5.89083e-04
  CSA_P2  : -4.44528e-05 ± 8.97104e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [57]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2194', '1.800', '0.1596', '1.800', '0.0903', '7.000', '0.7079', 1, 1, 1, 1, 1728386880.9871957]
VI_after__Init : ['1.202', '0.2195', '1.800', '0.1596', '1.800', '0.0846', '7.000', '0.7079', 1, 1, 1, 1, 1728386889.046511]
VI_at__the_End : ['1.201', '0.4771', '1.800', '0.1357', '1.800', '0.1127', '7.000', '0.7087', 1, 1, 1, 1, 1728386952.2575612]