TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_26_23
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-005-018-12 | FUSED_ID : 6359364768411701548
  IC_TEMP :  -73.06 | VDDM : 1117.64 | AUX_INT :   -8.84 | CsaBias :   53.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.65924e-03 / 2
  ADC_P0  : -8.84423e-03 ± 2.76536e-02
  ADC_P1  : 8.96429e-03 ± 7.27778e-04
  ADC_P2  : -6.55691e-06 ± 3.79680e-06
  CSA_Chi2/NDF : 2.05088e-04 / 2
  CSA_P0  : 6.09913e-02 ± 9.55196e-03
  CSA_P1  : 1.05558e-02 ± 7.19671e-04
  CSA_P2  : -6.10657e-05 ± 1.09597e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [21, 24]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [12, 83]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3096', '1.800', '0.1619', '1.800', '0.0916', '7.000', '0.7079', 1, 1, 1, 1, 1728386783.1917272]
VI_after__Init : ['1.201', '0.3095', '1.800', '0.1610', '1.799', '0.0862', '7.000', '0.7082', 1, 1, 1, 1, 1728386791.3340669]
VI_at__the_End : ['1.202', '0.4786', '1.800', '0.1422', '1.800', '0.1153', '7.000', '0.7088', 1, 1, 1, 1, 1728386853.0333235]