TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_24_44
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-005-019-12 | FUSED_ID : 6359364768411701564
  IC_TEMP :  -61.98 | VDDM : 1122.76 | AUX_INT :   -8.24 | CsaBias :   68.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21218e-03 / 2
  ADC_P0  : -8.23904e-03 ± 2.35299e-02
  ADC_P1  : 8.59384e-03 ± 5.78804e-04
  ADC_P2  : -7.02546e-06 ± 2.80862e-06
  CSA_Chi2/NDF : 1.22534e-04 / 2
  CSA_P0  : 5.88076e-02 ± 7.38329e-03
  CSA_P1  : 9.70481e-03 ± 5.56278e-04
  CSA_P2  : -4.39431e-05 ± 8.47145e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [37]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2386', '1.800', '0.1575', '1.800', '0.0877', '7.000', '0.7079', 1, 1, 1, 1, 1728386684.5884879]
VI_after__Init : ['1.202', '0.2386', '1.800', '0.1576', '1.800', '0.0823', '7.000', '0.7078', 1, 1, 1, 1, 1728386692.716867]
VI_at__the_End : ['1.202', '0.4919', '1.800', '0.1398', '1.800', '0.1104', '7.000', '0.7086', 1, 1, 1, 1, 1728386753.3091533]