TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_23_06
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-005-020-12 | FUSED_ID : 6359364768411701580
  IC_TEMP :  -63.72 | VDDM : 1116.21 | AUX_INT :   -8.43 | CsaBias :   69.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17543e-03 / 2
  ADC_P0  : -8.42657e-03 ± 2.31928e-02
  ADC_P1  : 8.72832e-03 ± 5.86332e-04
  ADC_P2  : -6.70491e-06 ± 2.93685e-06
  CSA_Chi2/NDF : 2.02584e-04 / 2
  CSA_P0  : 5.85918e-02 ± 9.49346e-03
  CSA_P1  : 1.06316e-02 ± 7.15264e-04
  CSA_P2  : -5.86505e-05 ± 1.08926e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [23, 70]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [35, 55, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3096', '1.800', '0.1504', '1.800', '0.0950', '7.000', '0.7080', 1, 1, 1, 1, 1728386585.621345]
VI_after__Init : ['1.201', '0.3104', '1.800', '0.1505', '1.800', '0.0894', '7.000', '0.7078', 1, 1, 1, 1, 1728386594.4295485]
VI_at__the_End : ['1.201', '0.4913', '1.800', '0.1398', '1.800', '0.1125', '7.000', '0.7090', 1, 1, 1, 1, 1728386651.8690164]