TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_21_28
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-005-021-12 | FUSED_ID : 6359364768411701596
  IC_TEMP :  -62.10 | VDDM : 1118.27 | AUX_INT :   -9.05 | CsaBias :   74.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36358e-03 / 2
  ADC_P0  : -9.04901e-03 ± 2.50020e-02
  ADC_P1  : 8.45717e-03 ± 6.11674e-04
  ADC_P2  : -6.27799e-06 ± 2.96891e-06
  CSA_Chi2/NDF : 1.27060e-04 / 2
  CSA_P0  : 5.75316e-02 ± 7.51842e-03
  CSA_P1  : 9.78741e-03 ± 5.66459e-04
  CSA_P2  : -4.62009e-05 ± 8.62650e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [36]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2970', '1.800', '0.1312', '1.800', '0.0929', '7.000', '0.7080', 1, 1, 1, 1, 1728386487.8219888]
VI_after__Init : ['1.202', '0.2970', '1.800', '0.1311', '1.800', '0.0873', '7.000', '0.7081', 1, 1, 1, 1, 1728386495.956369]
VI_at__the_End : ['1.201', '0.4863', '1.800', '0.1382', '1.800', '0.1129', '7.000', '0.7086', 1, 1, 1, 1, 1728386557.2364423]