TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_18_11
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-005-023-12 | FUSED_ID : 6359364768411701628
  IC_TEMP :  -58.89 | VDDM : 1122.36 | AUX_INT :   -7.13 | CsaBias :   57.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.73042e-04 / 2
  ADC_P0  : -7.12546e-03 ± 2.11290e-02
  ADC_P1  : 8.13439e-03 ± 5.10198e-04
  ADC_P2  : -5.19509e-06 ± 2.43873e-06
  CSA_Chi2/NDF : 1.76259e-04 / 2
  CSA_P0  : 5.59922e-02 ± 8.85518e-03
  CSA_P1  : 1.04491e-02 ± 6.67174e-04
  CSA_P2  : -5.22398e-05 ± 1.01603e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [47, 50]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1611', '1.800', '0.1619', '1.800', '0.0843', '7.000', '0.7082', 1, 1, 1, 1, 1728386291.2545292]
VI_after__Init : ['1.201', '0.1612', '1.800', '0.1620', '1.800', '0.0794', '7.000', '0.7079', 1, 1, 1, 1, 1728386299.4748867]
VI_at__the_End : ['1.202', '0.5010', '1.800', '0.1382', '1.800', '0.1062', '7.000', '0.7086', 1, 1, 1, 1, 1728386354.5414834]