TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_14_55
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-005-025-12 | FUSED_ID : 6359364768411701660
  IC_TEMP :  -55.61 | VDDM : 1120.90 | AUX_INT :   -7.69 | CsaBias :   73.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02741e-03 / 2
  ADC_P0  : -7.68691e-03 ± 2.16950e-02
  ADC_P1  : 8.18008e-03 ± 5.21095e-04
  ADC_P2  : -5.52977e-06 ± 2.47950e-06
  CSA_Chi2/NDF : 1.53973e-04 / 2
  CSA_P0  : 5.65490e-02 ± 8.27647e-03
  CSA_P1  : 1.04675e-02 ± 6.23572e-04
  CSA_P2  : -4.96983e-05 ± 9.49627e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [53, 74]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3197', '1.800', '0.1372', '1.800', '0.0870', '7.000', '0.7079', 1, 1, 1, 1, 1728386095.0734112]
VI_after__Init : ['1.201', '0.3197', '1.800', '0.1371', '1.800', '0.0820', '7.000', '0.7081', 1, 1, 1, 1, 1728386103.265774]
VI_at__the_End : ['1.201', '0.5143', '1.800', '0.1392', '1.800', '0.1087', '7.000', '0.7088', 1, 1, 1, 1, 1728386162.8538587]