TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_51_00
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-006-006-05 | FUSED_ID : 6359364768411705445
  IC_TEMP :  -70.08 | VDDM : 1110.70 | AUX_INT :   -8.81 | CsaBias :   43.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38421e-03 / 2
  ADC_P0  : -8.81499e-03 ± 2.52081e-02
  ADC_P1  : 8.76817e-03 ± 6.43141e-04
  ADC_P2  : -6.56933e-06 ± 3.25256e-06
  CSA_Chi2/NDF : 2.35269e-04 / 2
  CSA_P0  : 5.75383e-02 ± 1.02307e-02
  CSA_P1  : 1.04715e-02 ± 7.70808e-04
  CSA_P2  : -6.04608e-05 ± 1.17385e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [13]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [41, 77]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3344', '1.800', '0.1251', '1.800', '0.0900', '7.000', '0.7075', 1, 1, 1, 1, 1728388260.4218407]
VI_after__Init : ['1.202', '0.3351', '1.800', '0.1252', '1.800', '0.0845', '7.000', '0.7073', 1, 1, 1, 1, 1728388268.5362678]
VI_at__the_End : ['1.202', '0.4741', '1.799', '0.1395', '1.803', '0.1149', '7.000', '0.7079', 1, 1, 1, 1, 1728388323.2981138]