TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_52_39
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-006-007-05 | FUSED_ID : 6359364768411705461
  IC_TEMP :  -63.86 | VDDM : 1104.35 | AUX_INT :   -7.50 | CsaBias :   76.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.51950e-03 / 2
  ADC_P0  : -7.49641e-03 ± 2.64447e-02
  ADC_P1  : 8.44339e-03 ± 6.54136e-04
  ADC_P2  : -5.98533e-06 ± 3.20172e-06
  CSA_Chi2/NDF : 1.71272e-04 / 2
  CSA_P0  : 5.70992e-02 ± 8.72901e-03
  CSA_P1  : 9.71786e-03 ± 6.57668e-04
  CSA_P2  : -4.69794e-05 ± 1.00155e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [49]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [74]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2190', '1.800', '0.1535', '1.800', '0.0851', '7.000', '0.7072', 1, 1, 1, 1, 1728388358.7674632]
VI_after__Init : ['1.202', '0.2191', '1.800', '0.1535', '1.800', '0.0798', '7.000', '0.7073', 1, 1, 1, 1, 1728388366.709762]
VI_at__the_End : ['1.202', '0.4761', '1.800', '0.1382', '1.804', '0.1143', '7.000', '0.7083', 1, 1, 1, 1, 1728388433.7338068]