TEST_NAME : Wafer
TEST_DATE : 24_10_02-13_30_41
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-006-013-05 | FUSED_ID : 6359364768411705557
  IC_TEMP :  -70.71 | VDDM : 1125.04 | AUX_INT :   -8.74 | CsaBias :   69.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21724e-03 / 2
  ADC_P0  : -8.74173e-03 ± 2.35754e-02
  ADC_P1  : 8.80077e-03 ± 5.90792e-04
  ADC_P2  : -7.40094e-06 ± 2.92824e-06
  CSA_Chi2/NDF : 1.78986e-04 / 2
  CSA_P0  : 5.70465e-02 ± 8.92343e-03
  CSA_P1  : 1.03001e-02 ± 6.72316e-04
  CSA_P2  : -5.63811e-05 ± 1.02386e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [8]
 | N_BROKEN_SLOW :  [14, 34]
   P_BROKEN_DISC :  90
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  [0, 1, 2, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 17, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 34, 35, 41, 42, 45, 47, 48, 50, 54, 57, 58, 59, 60, 61, 62, 64, 66, 67, 68, 69, 70, 71, 72, 73, 74, 75, 76, 77, 78, 79, 80, 82, 84, 86, 87, 88, 90, 91, 92, 94, 95, 97, 98, 99, 101, 104, 105, 106, 107, 108, 109, 112, 113, 114, 115, 116, 117, 120, 121, 122, 124, 125, 126, 127]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2081', '1.800', '0.1536', '1.800', '0.0838', '7.000', '0.7079', 1, 1, 1, 1, 1727868641.7274432]
VI_after__Init : ['1.202', '0.2082', '1.800', '0.1537', '1.800', '0.0794', '7.000', '0.7081', 1, 1, 1, 1, 1727868649.7776906]
VI_at__the_End : ['1.202', '0.4777', '1.800', '0.1363', '1.802', '0.1151', '7.000', '0.7088', 1, 1, 1, 1, 1727868716.501538]