TEST_NAME : Wafer
TEST_DATE : 24_10_02-13_42_08
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-006-020-02 | FUSED_ID : 6359364768411705666
  IC_TEMP :  -66.41 | VDDM : 1120.69 | AUX_INT :   -7.69 | CsaBias :   61.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14605e-03 / 2
  ADC_P0  : -7.69434e-03 ± 2.29119e-02
  ADC_P1  : 8.69280e-03 ± 5.80544e-04
  ADC_P2  : -6.60395e-06 ± 2.90513e-06
  CSA_Chi2/NDF : 1.63733e-04 / 2
  CSA_P0  : 5.75861e-02 ± 8.53473e-03
  CSA_P1  : 9.66688e-03 ± 6.43031e-04
  CSA_P2  : -4.84264e-05 ± 9.79260e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [26, 32]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [9, 12]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1773', '1.800', '0.1606', '1.800', '0.0841', '7.000', '0.7085', 1, 1, 1, 1, 1727869328.0044065]
VI_after__Init : ['1.202', '0.1775', '1.800', '0.1607', '1.801', '0.0779', '7.000', '0.7080', 1, 1, 1, 1, 1727869336.01672]
VI_at__the_End : ['1.201', '0.4686', '1.800', '0.1377', '1.799', '0.1148', '7.000', '0.7086', 1, 1, 1, 1, 1727869396.422102]