TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_55_56
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-006-024-02 | FUSED_ID : 6359364768411705730
  IC_TEMP :  -60.64 | VDDM : 1118.78 | AUX_INT :   -9.61 | CsaBias :   81.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.68485e-03 / 2
  ADC_P0  : -9.61263e-03 ± 2.78733e-02
  ADC_P1  : 8.35917e-03 ± 6.82129e-04
  ADC_P2  : -5.57699e-06 ± 3.32432e-06
  CSA_Chi2/NDF : 1.39172e-04 / 2
  CSA_P0  : 6.02548e-02 ± 7.86860e-03
  CSA_P1  : 9.86107e-03 ± 5.92842e-04
  CSA_P2  : -4.63238e-05 ± 9.02829e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [4, 91, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [32, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0714', '1.800', '0.1521', '1.799', '0.0766', '7.000', '0.7072', 1, 1, 1, 1, 1728388556.1224663]
VI_after__Init : ['1.202', '0.0713', '1.800', '0.1522', '1.800', '0.0712', '7.000', '0.7072', 1, 1, 1, 1, 1728388564.0698628]
VI_at__the_End : ['1.202', '0.4936', '1.800', '0.1393', '1.800', '0.1115', '7.000', '0.7079', 1, 1, 1, 1, 1728388623.3343868]