TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_57_35
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-006-025-02 | FUSED_ID : 6359364768411705746
  IC_TEMP :  -58.82 | VDDM : 1119.90 | AUX_INT :   -8.15 | CsaBias :   76.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24950e-03 / 2
  ADC_P0  : -8.15125e-03 ± 2.39601e-02
  ADC_P1  : 8.56545e-03 ± 6.01775e-04
  ADC_P2  : -6.06543e-06 ± 2.99508e-06
  CSA_Chi2/NDF : 1.37038e-04 / 2
  CSA_P0  : 5.73942e-02 ± 7.80805e-03
  CSA_P1  : 1.00039e-02 ± 5.88280e-04
  CSA_P2  : -4.56095e-05 ± 8.95881e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [25, 56]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [52]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2517', '1.800', '0.1690', '1.800', '0.0886', '7.000', '0.7072', 1, 1, 1, 1, 1728388654.7140114]
VI_after__Init : ['1.202', '0.2519', '1.800', '0.1690', '1.800', '0.0830', '7.000', '0.7072', 1, 1, 1, 1, 1728388662.7903736]
VI_at__the_End : ['1.202', '0.5006', '1.800', '0.1425', '1.800', '0.1092', '7.000', '0.7079', 1, 1, 1, 1, 1728388729.6122751]