TEST_NAME : Wafer
TEST_DATE : 24_10_02-14_27_53
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-007-005-08 | FUSED_ID : 6359364768411709528
  IC_TEMP :  -65.84 | VDDM : 1123.31 | AUX_INT :   -8.13 | CsaBias :   60.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16299e-03 / 2
  ADC_P0  : -8.13425e-03 ± 2.30476e-02
  ADC_P1  : 8.60470e-03 ± 5.66939e-04
  ADC_P2  : -7.07804e-06 ± 2.75104e-06
  CSA_Chi2/NDF : 1.57748e-04 / 2
  CSA_P0  : 5.63489e-02 ± 8.37730e-03
  CSA_P1  : 9.85138e-03 ± 6.31169e-04
  CSA_P2  : -4.81416e-05 ± 9.61195e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [0, 70, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [39, 62, 75, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2444', '1.800', '0.1731', '1.800', '0.0909', '7.000', '0.7072', 1, 1, 1, 1, 1727872072.6170473]
VI_after__Init : ['1.202', '0.2447', '1.800', '0.1732', '1.801', '0.0868', '7.000', '0.7072', 1, 1, 1, 1, 1727872081.4612436]
VI_at__the_End : ['1.202', '0.4795', '1.800', '0.1372', '1.799', '0.1125', '7.000', '0.7078', 1, 1, 1, 1, 1727872149.335442]