TEST_NAME : Wafer
TEST_DATE : 24_10_02-14_16_25
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-007-012-08 | FUSED_ID : 6359364768411709640
  IC_TEMP :  -62.98 | VDDM : 1124.16 | AUX_INT :   -7.41 | CsaBias :   75.64
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.20499e-04 / 2
  ADC_P0  : -7.41379e-03 ± 2.04825e-02
  ADC_P1  : 8.37224e-03 ± 4.91962e-04
  ADC_P2  : -6.65162e-06 ± 2.32962e-06
  CSA_Chi2/NDF : 8.28244e-05 / 2
  CSA_P0  : 6.02568e-02 ± 6.07018e-03
  CSA_P1  : 9.39091e-03 ± 4.57344e-04
  CSA_P2  : -4.19354e-05 ± 6.96481e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [50, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2336', '1.800', '0.1174', '1.800', '0.0800', '7.000', '0.7070', 1, 1, 1, 1, 1727871385.7887821]
VI_after__Init : ['1.202', '0.2336', '1.800', '0.1175', '1.802', '0.0755', '7.000', '0.7069', 1, 1, 1, 1, 1727871393.9341362]
VI_at__the_End : ['1.201', '0.4824', '1.800', '0.1370', '1.804', '0.1109', '7.000', '0.7076', 1, 1, 1, 1, 1727871460.777052]