TEST_NAME : Wafer
TEST_DATE : 24_10_02-14_00_01
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-007-022-15 | FUSED_ID : 6359364768411709807
  IC_TEMP :  -68.92 | VDDM : 1116.17 | AUX_INT :   -8.02 | CsaBias :   68.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.29143e-03 / 2
  ADC_P0  : -8.01660e-03 ± 2.43511e-02
  ADC_P1  : 8.58049e-03 ± 6.09593e-04
  ADC_P2  : -6.34687e-06 ± 3.01673e-06
  CSA_Chi2/NDF : 1.63395e-04 / 2
  CSA_P0  : 5.72810e-02 ± 8.52593e-03
  CSA_P1  : 9.59617e-03 ± 6.42368e-04
  CSA_P2  : -4.85895e-05 ± 9.78250e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [5, 99, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3305', '1.800', '0.1480', '1.800', '0.0929', '7.000', '0.7078', 1, 1, 1, 1, 1727870400.8538177]
VI_after__Init : ['1.202', '0.3306', '1.800', '0.1481', '1.800', '0.0873', '7.000', '0.7080', 1, 1, 1, 1, 1727870408.9752727]
VI_at__the_End : ['1.202', '0.4658', '1.800', '0.1360', '1.802', '0.1154', '7.000', '0.7085', 1, 1, 1, 1, 1727870475.4852467]