TEST_NAME : Wafer
TEST_DATE : 24_10_02-14_37_43
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-008-005-12 | FUSED_ID : 6359364768411713628
  IC_TEMP :  -53.97 | VDDM : 1107.21 | AUX_INT :  -99.77 | CsaBias :   18.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28009e-03 / 2
  ADC_P0  : -9.97683e-02 ± 2.88992e-02
  ADC_P1  : 9.25926e-03 ± 6.47726e-04
  ADC_P2  : -9.75763e-06 ± 2.84575e-06
  CSA_Chi2/NDF : 8.01453e-05 / 2
  CSA_P0  : 5.78444e-02 ± 5.97120e-03
  CSA_P1  : 9.11906e-03 ± 4.49887e-04
  CSA_P2  : -3.72636e-05 ± 6.85124e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [16, 25, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [51]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3208', '1.800', '0.1526', '1.800', '0.0951', '7.000', '0.7074', 1, 1, 1, 1, 1727872663.5201054]
VI_after__Init : ['1.202', '0.3210', '1.800', '0.1526', '1.800', '0.0897', '7.000', '0.7074', 1, 1, 1, 1, 1727872671.755424]
VI_at__the_End : ['1.202', '0.4801', '1.800', '0.1345', '1.799', '0.1106', '7.000', '0.7082', 1, 1, 1, 1, 1727872738.430027]