TEST_NAME : Wafer
TEST_DATE : 24_10_02-14_55_45
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-008-016-11 | FUSED_ID : 6359364768411713803
  IC_TEMP :  -63.49 | VDDM : 1125.04 | AUX_INT :   -8.74 | CsaBias :   69.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21724e-03 / 2
  ADC_P0  : -8.74173e-03 ± 2.35754e-02
  ADC_P1  : 8.80077e-03 ± 5.90792e-04
  ADC_P2  : -7.40094e-06 ± 2.92824e-06
  CSA_Chi2/NDF : 1.24998e-04 / 2
  CSA_P0  : 6.08715e-02 ± 7.45716e-03
  CSA_P1  : 9.85819e-03 ± 5.61843e-04
  CSA_P2  : -4.88032e-05 ± 8.55621e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [0, 46, 48, 113, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1260', '1.800', '0.1853', '1.799', '0.0810', '7.000', '0.7076', 1, 1, 1, 1, 1727873744.5269022]
VI_after__Init : ['1.202', '0.1261', '1.800', '0.1844', '1.800', '0.0758', '7.000', '0.7075', 1, 1, 1, 1, 1727873753.3561962]
VI_at__the_End : ['1.202', '0.4844', '1.800', '0.1389', '1.799', '0.1139', '7.000', '0.7084', 1, 1, 1, 1, 1727873819.3030682]