TEST_NAME : Wafer
TEST_DATE : 24_10_02-16_02_51
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-010-005-15 | FUSED_ID : 6359364768411721823
  IC_TEMP :  -64.03 | VDDM : 1120.88 | AUX_INT :   -8.64 | CsaBias :   80.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55819e-03 / 2
  ADC_P0  : -8.64331e-03 ± 2.67482e-02
  ADC_P1  : 8.17724e-03 ± 6.33943e-04
  ADC_P2  : -5.74194e-06 ± 2.98460e-06
  CSA_Chi2/NDF : 1.26953e-04 / 2
  CSA_P0  : 5.87821e-02 ± 7.51527e-03
  CSA_P1  : 9.48389e-03 ± 5.66221e-04
  CSA_P2  : -4.28107e-05 ± 8.62288e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [29]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2789', '1.800', '0.1744', '1.800', '0.0893', '7.000', '0.7076', 1, 1, 1, 1, 1727877770.7738345]
VI_after__Init : ['1.202', '0.2792', '1.800', '0.1745', '1.800', '0.0845', '7.000', '0.7078', 1, 1, 1, 1, 1727877778.7791293]
VI_at__the_End : ['1.201', '0.4833', '1.800', '0.1366', '1.800', '0.1143', '7.000', '0.7086', 1, 1, 1, 1, 1727877846.7478895]