TEST_NAME : Wafer
TEST_DATE : 24_10_02-16_07_46
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-010-008-15 | FUSED_ID : 6359364768411721871
  IC_TEMP :  -57.77 | VDDM : 1123.49 | AUX_INT :   -7.39 | CsaBias :   81.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16730e-03 / 2
  ADC_P0  : -7.39497e-03 ± 2.31765e-02
  ADC_P1  : 8.16367e-03 ± 5.64506e-04
  ADC_P2  : -5.04759e-06 ± 2.72308e-06
  CSA_Chi2/NDF : 1.34090e-04 / 2
  CSA_P0  : 5.78962e-02 ± 7.72360e-03
  CSA_P1  : 9.95405e-03 ± 5.81917e-04
  CSA_P2  : -4.78055e-05 ± 8.86191e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [38, 67, 108, 110, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [47]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2373', '1.800', '0.1123', '1.799', '0.0891', '7.000', '0.7080', 1, 1, 1, 1, 1727878065.572073]
VI_after__Init : ['1.202', '0.2374', '1.800', '0.1124', '1.800', '0.0840', '7.000', '0.7079', 1, 1, 1, 1, 1727878074.4894788]
VI_at__the_End : ['1.201', '0.4933', '1.800', '0.1385', '1.807', '0.1118', '7.000', '0.7086', 1, 1, 1, 1, 1727878139.3107195]