TEST_NAME : Wafer
TEST_DATE : 24_10_02-16_35_37
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-010-025-08 | FUSED_ID : 6359364768411722136
  IC_TEMP :  -53.57 | VDDM : 1126.31 | AUX_INT :   -7.29 | CsaBias :   73.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22436e-03 / 2
  ADC_P0  : -7.28692e-03 ± 2.37291e-02
  ADC_P1  : 8.17980e-03 ± 5.76095e-04
  ADC_P2  : -5.31657e-06 ± 2.76361e-06
  CSA_Chi2/NDF : 1.07859e-04 / 2
  CSA_P0  : 5.83596e-02 ± 6.92709e-03
  CSA_P1  : 9.65955e-03 ± 5.21906e-04
  CSA_P2  : -4.14361e-05 ± 7.94802e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [21]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3745', '1.800', '0.1594', '1.800', '0.0905', '7.000', '0.7077', 1, 1, 1, 1, 1727879736.7703128]
VI_after__Init : ['1.201', '0.3745', '1.800', '0.1594', '1.801', '0.0855', '7.000', '0.7080', 1, 1, 1, 1, 1727879745.4735885]
VI_at__the_End : ['1.202', '0.4989', '1.800', '0.1377', '1.801', '0.1106', '7.000', '0.7090', 1, 1, 1, 1, 1727879804.5150416]